Data Defect Correlation: A Unified Quality Metric for Probabilistic and Non-probabilistic Samples.
Whipple V. N. Jones Professor of Statistics, and Founding Editor-in-Chief of Harvard Data Science Review.
Professor Rod Little
Richard D. Remington Distinguished University Professor of Biostatistics
University of Michigan
Stephanie Eckman, P.hD.
Fellow in Survey Research Division at RTI International